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Anhui Liwei Chemical Co., Limited.

FIRST anti-PID EVA Film for LECO-TOPCon S406 (P)

    • Product Name: FIRST anti-PID EVA Film for LECO-TOPCon S406 (P)
    • Factroy Site: Lingwu, Yinchuan, Ningxia, China
    • Price Inquiry: sales2@liwei-chem.com
    • Manufacturer: Anhui Liwei Chemical Co., Limited.
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    Specifications
    HS Code 117135
    Product Code S406 (P)
    Product Name FIRST anti-PID EVA Film for LECO-TOPCon S406 (P)
    Brand FIRST
    Material Ethylene-vinyl acetate copolymer
    Film Type Anti-PID EVA encapsulant film
    Target Application LECO-TOPCon photovoltaic modules
    Thickness 0.5 mm
    Width 1000–2200 mm
    Length 100–400 m
    Density 0.94 g/cm³
    Melt Flow Rate 2–6 g/10 min
    Light Transmittance ≥91%
    Haze ≤2%
    Refractive Index 1.48
    Volume Resistivity ≥1.0×10^15 Ω·cm
    Water Vapor Transmission Rate ≤30 g/m²·day
    Tensile Strength ≥18 MPa
    Elongation At Break ≥500%
    Gel Content ≥75%
    Thermal Shrinkage ≤3%
    Pid Resistance Passes 85°C/85% RH, -1500 V, 96 h

    As an accredited FIRST anti-PID EVA Film for LECO-TOPCon S406 (P) factory, we enforce strict quality protocols—every batch undergoes rigorous testing to ensure consistent efficacy and safety standards.

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    Application of FIRST anti-PID EVA Film for LECO-TOPCon S406 (P)

    Does LECO Front-Side Contact Metallurgy Shift the Required Encapsulant Acid-Generation Ceiling?

    In high-volume TOPCon module manufacturing, the insertion point for a 0.50 mm anti-PID EVA film is the layup station after stringing and flux drying. Because the product is a thermally curable encapsulant sheet rather than a masterbatch, the relevant formulation-application metrics are cut-area ratio, layer count, areal density, and internal additive loading. The standard glass-backsheet stack for a 182 mm half-cut LECO-TOPCon cell matrix comprises 3.2 mm low-iron patterned solar glass, a front S406(P) sheet, the cell string matrix, a rear S406(P) sheet, and a 0.30–0.35 mm PVDF- or polyamide-based backsheet. Compliance is governed by IEC 61215-2:2021 MQT 13 damp-heat 1000 h, IEC 61215-2:2021 MQT 11 thermal cycling TC200, and the PID qualification sequence in IEC TS 62804-1:2015 at 85 °C/85 % RH with module front-bias −1000 V for 96 h. In the layup, S406(P) is cut to 1.05–1.10 m² per 1.00 m² of glass aperture, leaving a 5–8 mm edge margin before trimming. The dual-layer usage is 0.94–1.02 kg/m² of module aperture at a nominal areal density of 470–510 g/m² per 0.50 mm layer. The base resin is an ethylene-vinyl acetate copolymer with vinyl acetate content in the 28–33 wt% range; the crosslinking package is 1.0–1.5 phr peroxide, silane adhesion promoter is 0.3–0.5 phr, and the anti-PID ion-capture package is below 0.5 wt%. Published data for the exact S406(P) additive loading is limited. Film storage before cutting requires conditioning at 20–25 °C and <60 % RH; rolls exposed to relative humidity above 60 % are pre-dried for 12 h at 40 °C to prevent hydrolysis and interfacial void formation. Lamination on a multi-chamber vacuum laminator with oil-heated platens sized 2.2 m × 1.1 m is configured as follows: chamber one temperature 145 °C, vacuum −60 kPa, dwell 5–7 min; chamber two temperature 150 °C, vacuum −100 kPa, dwell 8–10 min; chamber three cools the stack to <55 °C under positive membrane pressure. Crosslink density is checked by ASTM D2765-16 solvent extraction and held between 75 % and 85 % gel content. Glass peel adhesion after damp heat is benchmarked at ≥ 60 N/cm against IEC 62788-1-4:2021; production lines running below 72 % gel content or cycle times under 240 s accumulate edge creep and backsheet delamination failures after 1000 h damp heat. Finished terminal product types are monofacial framed TOPCon modules rated 530–590 Wp with module efficiency 22.2–23.1 %, used in distributed generation and commercial rooftop arrays.

    Does LECO Front-Side Contact Metallurgy Require a Low Acetate Encapsulant to Prevent Interface Recombination?

    Laser-enhanced contact optimization on TOPCon cells produces a densified silver-rich contact interface by local laser redistribution of the front-side Ag/Al paste after firing; the resulting contact region carries higher local current density and is more sensitive to acetic acid species released during EVA cure. Published data for the exact S406(P) acid-generation value is limited; the product class is formulated with a low free-acetate EVA base and an ion-capture stabilizer below 0.5 wt%. Formulation addition ratio at the lamination layup is 1.05–1.10 m² of front film per 1.00 m² of module area, at 0.50 mm thickness and 470–510 g/m² areal density; the rear film may be reduced to 0.40 mm in glass-backsheet construction to limit edge strain and material cost. Process control begins with infrared reflow stringing of copper-cored interconnect ribbons of 0.20–0.30 mm thickness; solder peak temperature is 330–370 °C for 2–3 s per contact, while cell surface temperature is not allowed to exceed 220 °C to avoid LECO contact passivation damage. Amine-based long-chain flux activators are avoided because residual amine accelerates transesterification and reduces gel content. After stringing, flux volatiles are dried to a residue below 2 µg/cm²; higher residue reduces EVA adhesion and creates interfacial voids after lamination. Lamination uses a 145–150 °C plateau for 13–16 min at −100 kPa vacuum in the second chamber, after which gel content is verified by ASTM D2765-16 solvent extraction against a 75–85 % target. Electrical compliance for terminal modules includes IEC 61215-2:2021 MQT 13 damp heat 1000 h with power retention ≥ 95 %, IEC TS 62804-1:2015 PID stress 96 h with degradation ≤ 5 %, and IEC 60904-1 I-V measurement repeatability. Terminal product types are high-efficiency TOPCon modules in 120- or 132-half-cell formats rated 580–620 Wp and 22.5–23.5 % module efficiency, supplied to utility and industrial rooftop markets.

    Standard / methodApplicable TOPCon lamination criterionMeasured endpoint
    IEC TS 62804-1:2015PID stress front or rear biasPower degradation ≤ 5 % after 96 h
    IEC 61215-2:2021 MQT 13Damp heat 1000 hPower retention ≥ 95 %
    IEC 61215-2:2021 MQT 11Thermal cycling TC200No visual defect, insulation resistance ≥ 40 MΩ·m²
    ASTM D2765-16Gel content by solvent extraction75–85 %
    IEC 62788-1-4:2021Adhesion after damp heat60 N/cm
    ISO 4892-3:2016UV preconditioningΔYI ≤ 2.0 after 60 kWh/m²

    When Rear-Side Glass Is Introduced, Lamination Cycle Time and 1500 V Ground Potential Shift Simultaneously

    In glass-glass bifacial module production, replacing the polymer backsheet with a second glass lite changes both the heat transfer path and the long-term electrical bias on the encapsulant. The bifacial LECO-TOPCon stack uses two 2.0 mm heat-strengthened glass lites, a front 0.50 mm S406(P) layer, the cell matrix, and a rear 0.40 mm transparent EVA or POE/EVA co-extruded layer. Formulation addition ratio: total encapsulant consumption is 0.90–1.00 kg/m² of module aperture; the rear transparent layer typically contains a UV-blocking package below 0.3 wt% to preserve rear-side transmittance above 91 % in the 380–1100 nm range. Compliance for this segment includes IEC 61215-2:2021 MQT 13 damp heat 2000 h, IEC TS 62804-1:2015 PID at 85 °C/85 % RH for 192 h with both ±1500 V front and rear-bias, and UL 61730-1 system voltage endurance. Process changes are measurable: heat transfer through two glass lites lowers the heating ramp to 3–5 °C/min until the platen temperature reaches 150 °C, and the cure plateau extends to 18–24 min to bring the rear glass interface above 135 °C for the required time. Multi-chamber laminators with silicone membranes at 0.6–0.8 bar membrane pressure are preferred over lower-pressure flat-platen systems, because glass-glass stacks show edge bubble formation when membrane pressure drops below 0.5 bar. Edge gel content is maintained above 80 %; low edge crosslink allows moisture channels in field installations. Terminal products are utility-scale bifacial modules rated 600–675 Wp with 23.0–24.0 % module efficiency, deployed on single-axis trackers and fixed-tilt ground-mount systems.

    When Facade Lamination Requires Simultaneous Safety-Glass Impact Resistance and PID Stability

    Architectural BIPV production inserts S406(P) between two heat-treated glass lites as both a photovoltaic encapsulant and a laminated safety-glass interlayer. The standard stack for a semi-transparent TOPCon facade module is 6 mm tempered glass / 0.50 mm S406(P) / laser-scribed or spaced TOPCon cell arrays / 0.50 mm S406(P) / 6 mm tempered glass. Compliance includes EN 12543-2 for laminated glass interlayer performance, EN 12600:2002 pendulum impact classification, IEC 61215-2:2021 MQT 13, and IEC TS 62804-1:2015 PID stress 96 h. Formulation addition ratio: the two-layer interlayer totals 0.94–1.02 kg/m² of glazing area; edge deletion is set to 10–12 mm to prevent moisture ingress and maintain partial discharge resistance. The production process differs from standard PV lamination: a vacuum-bag laminator pulls −95 kPa at 140–150 °C for 30 min to preliminary bond, then the lite is transferred to an autoclave at 12–14 bar and 135–140 °C for 60–120 min. This two-stage route compresses residual air bubbles and drives adhesion to the glass above 60 N/cm. The resulting terminal product types are semitransparent facade modules, skylight units, and laminated safety-glass balustrades with outputs of 300–420 Wp and visible light transmittance 35–60 %.

    Across high-humidity greenhouse and agrivoltaic shelter installations, TOPCon modules are exposed to condensation, fertilizer-derived ammonia, and ground-level PID stress not fully reproduced by indoor damp-heat testing. The encapsulant specification therefore extends beyond standard module qualification: compliance for the agrivoltaic downstream segment includes IEC 61215-2:2021 MQT 13 extended to 2000 h, IEC TS 62804-1:2015 PID at −1000 V for 192 h, IEC 61701:2020 salt mist cycling for units near coastal windbreaks, and ISO 4892-3:2016 UV radiation exposure to track yellowing-index shift. The layup typically uses a front S406(P) film at 0.50 mm and a rear encapsulant at 0.40 mm, giving a total encapsulant consumption of 0.90–1.00 kg/m²; the UV-stabilizer package is 0.1–0.3 wt% and the anti-PID package remains below 0.5 wt%. Production process adjustments include a longer 16–18 min lamination plateau at 145–150 °C to maximize gel content at the busbar exit area, followed by post-lamination edge trimming to 4 mm tolerance and junction-box potting to IP68. Terminal product types are semi-transparent and opaque agrivoltaic modules rated 300–500 Wp with photosynthetic photon flux transmittance 20–30 %, mounted above row crops at 3.5–5.0 m height.

    Lamination conditionGel contentGlass peel adhesionObserved process risk
    140 °C, 12 min68–72 %45–55 N/cmUnder-cure, edge creep after damp heat
    145 °C, 16 min78–82 %60–70 N/cmAcceptable for glass-backsheet single-piece cycles
    150 °C, 18 min82–86 %65–75 N/cmPreferred for glass-glass, floating, and BIPV stacks
    155 °C, 20 min84–87 %60–65 N/cmYellowing-index increase, overcure brittleness

    Extended Damp-Heat and Salt-Mist Qualification Benchmarks Cannot Fully Substitute for On-Water Encapsulant Edge-Failure Monitoring

    Floating photovoltaic arrays impose continuous humidity, salt aerosol, and high string voltage on the encapsulant, making edge seal integrity and crosslink density central to anti-PID performance. Compliance for floating deployments includes IEC 61215-2:2021 MQT 13 extended to 2000 h, IEC 61701:2020 salt mist exposure, IEC TS 62804-1:2015 PID stress at 85 °C/85 % RH for 192 h with ±1500 V bias, and IEC 62716:2013 ammonia corrosion where biofouling or fertilizer runoff is anticipated. Formulation addition ratio: double-glass floating modules use a front 0.50 mm S406(P) and a rear 0.40 mm transparent EVA/POE layer, totaling 0.90–1.00 kg/m²; the film is paired with a butyl edge seal of 8–10 mm width to reduce water-vapor transport at the edge to below 0.15 g/m²/day. The lamination process uses a slow ramp from 60 °C to 150 °C at 3–4 °C/min, a cure plateau of 18–24 min, and forced cooling to <55 °C under membrane pressure to minimize glass warp. Edge crosslink density is measured by solvent extraction of the outer 10 mm strip and must exceed 80 % gel content; values below this threshold correlate with moisture-driven electroluminescence darkening after 1500 h. Terminal product types are double-glass floating arrays rated 550–620 Wp, with corrosion class C4 or C5 mounting and string voltages up to 1500 V DC.

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    Certification & Compliance
    More Introduction

    Product identity for FIRST anti-PID EVA Film for LECO-TOPCon S406 (P) corresponds to a crosslinkable ethylene-vinyl acetate encapsulant formulated for laser-enhanced contact optimization tunnel oxide passivated contact (LECO-TOPCon) solar cells. The film is supplied as a cast extruded sheet on release liner in rolls, with thickness and slit width specified at order. The anti-PID designation indicates a reduced free-acid formulation rather than a barrier-layer replacement. In module production, the film is placed between the glass frontsheet and the LECO-TOPCon cell string, and optionally between cells and a glass or backsheet rear substrate, before vacuum lamination at 145–155 °C. Published data for this specific configuration is limited; therefore the following technical description uses class-level values for anti-PID EVA encapsulants and standard certification methods.

    What Distinguishes an Anti-PID EVA Formulation from Standard EVA in TOPCon Module Architectures?

    The primary differentiation arises from three mechanisms. Standard EVA with vinyl acetate content 28–33 wt% is known to release acetic acid during damp heat exposure; anti-PID grades for TOPCon are compounded to reduce the free-acid reservoir and to maintain volume resistivity after cure. The S406 (P) group is specified for glass-facing and backsheet-facing placement in modules where sodium ion migration from the glass under high system voltage must be suppressed. Volume resistivity after lamination is maintained above 1.0 × 1014 Ω·cm when measured by IEC 60093. Adhesion to glass after 1000 h damp heat at 85 °C/85 % RH is targeted above 60 N/cm peel force; standard EVA may lose adhesion due to acid buildup at the interface. POE and EPE encapsulants provide lower moisture vapour transmission and negligible acetic acid evolution but have lower tack and require longer lamination dwell or higher platen setpoints. The present grade is designed to run in conventional EVA-capable vacuum laminators without changing the backsheet sealing path.

    Comparative encapsulant property matrix for TOPCon glass-backsheet modules
    Property Standard EVA Anti-PID EVA S406 (P) class POE/EPE
    Free-acid contribution after damp heat 1000 h High Low Negligible
    Volume resistivity after cure 1 × 1013–1 × 1014 Ω·cm ≥1.0 × 1014 Ω·cm 1 × 1015–1 × 1016 Ω·cm
    Glass adhesion retention after damp heat Moderate to low High Moderate to high
    Moisture vapour transmission into cell plane Higher Intermediate Lowest
    Processability in EVA-capable vacuum laminators Established Established with tighter cure window Requires modified thermal profile

    Because LECO-TOPCon cells contain local silver contact regions formed by laser-enhanced contact optimization, acid-induced corrosion is more detrimental than in conventional passivated emitter rear contact cells. The anti-PID formulation is therefore specified for both front-side and rear-side encapsulation in bifacial LECO-TOPCon modules, where the rear side may be a transparent backsheet or glass.

    Production-scale qualification of anti-PID EVA for TOPCon generally uses single-chamber or multi-chamber vacuum laminators with silicone bladder membranes, platen temperature uniformity of ±3 °C or better, and vacuum levels below 100 Pa. The processing window for S406 (P) is determined by peroxide decomposition kinetics and melt-flow behaviour. The film’s melt mass-flow rate at 190 °C and 2.16 kg load is in the range 15–30 g/10 min per ISO 1133-1:2022; this allows glass wetting and cell-string encapsulation without excessive edge bleed. Cure initiates when the encapsulant reaches 135–145 °C, with complete crosslinking achieved only after the platen setpoint is held at 145–155 °C for 8–12 min. Lamination below the initiation temperature produces undercured films with gel content below 70 %; overlamination above 160 °C increases thermal stress on LECO-TOPCon contacts and can cause backsheet embrittlement. Gel fraction after cure is measured by solvent extraction per ASTM D2765-16 and is normally 75–90 %.

    Thickness control is critical for bubble-free lamination over cell edges and busbars. Available thicknesses in this class usually include 0.45 mm, 0.50 mm, and 0.55 mm for front-side use, with rear-side film selected according to backsheet texture and cell spacing. Cross-web thickness variation is typically held below ±3 % for master rolls up to 2200 mm, and slit-roll width tolerance is normally ±2 mm. At lamination temperature, the film must retain sufficient melt strength to avoid glass-edge bleed while filling the intercell gaps. These requirements are evaluated on a production laminator using glass-to-backsheet thermocouple mapping and post-lamination cross-sectional microscopy.

    When Lamination Is Run Below the Peroxide Decomposition Threshold, Crosslink Density and Interfacial Wetting Become the Dominant Process Risks

    Below 135 °C platen temperature, residual peroxide remains unreacted in the encapsulant layer. The immediate consequence is not only low gel content but also delayed acid formation during subsequent module service. Under damp heat, unreacted peroxide and residual vinyl acetate monomers contribute to free-acid generation at the cell-encapsulant interface. For LECO-TOPCon cells, this interface is critical because the laser-enhanced contact region has a higher density of local silver crystallites and passivation steps than conventional PERC emitters; acidic interfacial species can accelerate corrosion and increase series resistance. A closed-loop laminator profile with thermocouple attachment to the front glass and rear backsheet is recommended. The temperature difference between glass and backsheet should remain below 10 °C during the heat-up ramp; larger gradients produce differential melt flow and can create cell displacement or macrobubble entrapment. Vacuum ramp rate is commonly set to 10–20 Pa/s until the chamber reaches 100 Pa, followed by membrane pressurization to 80–100 kPa.

    When the S406 (P) film is laminated in glass-glass LECO-TOPCon construction, edge seal width and encapsulant overhang should be qualified by cross-sectional microscopy after thermal cycling 200 cycles from −40 °C to +85 °C per IEC 61215-2:2021. Edge delamination exceeding 2 mm from the module edge is defined as a process limit because moisture ingress and potential-induced sodium migration initiate from exposed glass edges. Lamination recipes should be locked to a specific module stack; a change in front glass thickness from 2.0 mm to 3.2 mm alters heat-up lag and requires profile compensation to maintain gel fraction above 75 %.

    Under IEC TS 62804-1:2015 potential-induced degradation stress at 1000 V system bias, 85 °C chamber temperature, and 85 % RH, pass/fail is recorded at 96 h or 192 h depending on module design qualification. Anti-PID EVA films are evaluated for power retention after the stress cycle; values above 95 % at 192 h are commonly used as an internal acceptance threshold for glass-backsheet TOPCon modules. No public product-specific dataset for S406 (P) is available; conformity should be demonstrated on the finished module with the actual front glass and backsheet combination.

    Accelerated Aging and Potential-Induced Degradation Test Responses in Glass-Backsheet and Glass-Glass Configurations

    Accelerated aging testing under IEC 61215-2:2021 thermal cycling, damp heat, and humidity freeze is used to qualify encapsulated LECO-TOPCon modules rather than the film alone. In glass-backsheet constructions, the dominant failure mode is corrosion of LECO contacts due to acid and moisture accumulation at the rear side. In glass-glass constructions, the dominant failure mode is sodium ion migration from the front glass through the encapsulant to the cell surface under negative bias. The S406 (P) film is positioned to reduce both failure routes by limiting free-acid evolution and increasing bulk resistivity. Damp heat exposure for 1000 h at 85 °C/85 % RH should be followed by wet leakage current testing per IEC 61215-2:2021 MQT 15; insulation resistance should remain above 40 MΩ·m². Thermal cycling 200 cycles from −40 °C to +85 °C is used to assess encapsulant adhesion and cell interconnection fatigue.

    Compliance checklist matrix for anti-PID EVA encapsulant release documentation
    Documentation item Standard/method Typical content required for S406 (P)
    Melt volume-flow rate ISO 1133-1:2022 15–30 g/10 min at 190 °C/2.16 kg
    Volume resistivity after cure IEC 60093 ≥1.0 × 1014 Ω·cm
    Gel fraction ASTM D2765-16 75–90 %
    Light transmittance 380–1100 nm ISO 13468-2:2021 ≥91 %
    Yellowness index after damp heat ASTM E313-20 Δ YI ≤2
    PID stress IEC TS 62804-1:2015 Final module power retention at defined bias

    Incoming roll storage requires 5–30 °C warehouse conditions and ≤60 % RH. Cold rolls should be conditioned in the lamination hall until surface temperature is within 5 °C of ambient to prevent condensation. Pre-drying is not generally required for EVA encapsulant if the release liner is undamaged; however, if the roll has been exposed to RH >60 % for more than 48 h, a desiccant cabinet or dry-air purge at 30 °C for 24 h is advised. Slitting and layup must avoid folding or liner delamination because local thickness variation above 10 % affects lamination bubble formation and cell displacement. The material should not be combined with amine-based backsheet primers or uncured silicone edge sealants during layup; amine species can interfere with peroxide crosslinking and reduce gel fraction at the interface.