| HS Code | 971309 |
| Product Name | FIRST Normal Series EVA Film F806P (UV cut-off) |
| Brand | FIRST |
| Series | Normal Series |
| Model | F806P |
| Type | EVA Encapsulant Film |
| Base Material | Ethylene Vinyl Acetate |
| Uv Cut Off | Yes |
| Color | Transparent |
| Thickness | 0.45 mm |
| Thickness Tolerance | ±0.03 mm |
| Width | 1000-2200 mm |
| Length | 100 m/roll |
| Density | 0.95 g/cm³ |
| Melt Flow Rate | 6-8 g/10 min |
| Melting Point | 70 °C |
| Vicat Softening Point | ≥70 °C |
| Light Transmittance | ≥91% |
| Haze | ≤2% |
| Yellow Index | ≤2 |
| Uv Cut Off Wavelength | ≤360 nm |
| Uv Transmittance | ≤5% |
| Adhesion To Glass | ≥60 N/cm |
| Adhesion To Backsheet | ≥40 N/cm |
| Crosslinking Degree | ≥75% |
| Gel Content | ≥75% |
| Tensile Strength | ≥16 MPa |
| Elongation At Break | ≥500% |
| Thermal Shrinkage | ≤3% |
| Water Absorption | ≤0.1% |
| Volume Resistivity | ≥1×10^15 Ω·cm |
| Dielectric Constant | 2.8 |
| Breakdown Voltage | ≥20 kV/mm |
| Thermal Conductivity | 0.35 W/m·K |
| Specific Heat Capacity | 2.0 kJ/kg·K |
| Refractive Index | 1.48 |
| Storage Temperature | 5-30 °C |
| Storage Humidity | ≤60% RH |
| Shelf Life | 12 months |
| Packaging | Vacuum aluminum foil bag |
| Curing Temperature | 145-150 °C |
| Curing Time | 15-20 min |
As an accredited FIRST Normal Series EVA Film F806P (UV cut-off) factory, we enforce strict quality protocols—every batch undergoes rigorous testing to ensure consistent efficacy and safety standards.
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In flat-plate crystalline silicon module production, F806P is processed as the front-side encapsulant between low-iron tempered solar glass and the cell string. The film enters the laminator as a 0.45–0.60 mm calendered sheet with a vinyl acetate content in the 28–33 wt% range. Melt flow rate is controlled to 25–35 g/10 min at 190 °C under 2.16 kg load when tested according to ISO 1133-1:2022. The ultraviolet cut-off package absorbs high-energy photons below 380 nm before they reach the cell metallization and the EVA/backsheet primer interface. This is critical for PERC and TOPCon cells whose rear-side passivation stacks and busbar adhesion systems are susceptible to UV-initiated chain scission at the module perimeter. The film is conditioned at 20–25 °C and 40–60% RH for 4–8 h before unrolling. Unrolling tension is set below 15 N per full roll width to avoid neck-in. At the layup station, the F806P sheet is cut 10–20 mm oversized to the glass edge to allow flow into the edge gap. A second F806P sheet is placed behind the cell string. Front and rear sheets are usually identical unless backsheet adhesion requires a different vinyl acetate content. On a single-chamber membrane laminator, platen setpoints are maintained between 148 °C and 162 °C. Vacuum draw lasts 3–5 min to remove air and moisture from the cell gap. Membrane pressure is then applied at 0.060–0.085 MPa for 8–12 min to complete peroxide decomposition and crosslinking. The gel fraction target after lamination is 75–85% by xylene extraction. If gel content falls below 70%, the film retains thermoplastic flow under load and edge creep appears during hot-spot testing. If gel content exceeds 90%, peel adhesion to glass drops because over-cure embrittles the silane glass-bonding layer. Production-scale failure modes include bubble clusters at cell corners, busbar delamination after damp heat 85 °C / 85% RH, and post-lamination shrinkage of 1.5–3.0% in machine direction when the supplied film is not conditioned at 20–25 °C and 40–60% RH. Module qualification for this stack is evaluated under IEC 61215-1:2021 and safety under IEC 61730-2:2016.
| Standard designation | Test method or clause | Condition | Relevance to F806P integration |
|---|---|---|---|
| ISO 1133-1:2022 | Melt flow rate | 190 °C, 2.16 kg | Incoming film viscosity control before laminator loading |
| ASTM E313-20 | Yellowness index | D65 / 10° observer | Post-cure discoloration from over-cure or ultraviolet shielding failure |
| IEC 61215-1:2021 | Ultraviolet preconditioning | 15 kWh/m² | Front-side ultraviolet dose stability for long-term deployment |
| ISO 4892-2:2013 | Xenon arc weathering | 2,000 h | Yellowing resistance in long-lifetime building-integrated modules |
| IEC TS 62804-1:2015 | PID resistance | 85 °C / 85% RH, 96 h | Limitation boundary for glass-glass high-voltage arrays |
In a glass-glass bifacial construction, the second sheet of heat-strengthened glass adds thermal mass. The mid-laminate thermocouple can lag the platen setpoint by 6–10 °C during the first 5 min of the cure cycle. Operators compensate by either raising platen temperature 5–8 °C or extending the press dwell 3–5 min. Both adjustments alter the peroxide decomposition curve. Raising platen temperature above 168 °C can trigger scorch in the film before the cell string fully settles into the melted EVA. The resulting yellowing is measured as yellowness index under ASTM E313-20 and cannot be corrected after lamination. The cure plateau is reached 4–6 min after the platen reaches setpoint. Rheological behavior during this window is non-Newtonian; the film exhibits shear thinning under membrane pressure. If press pressure is applied too early, before the EVA has filled the inter-cell gaps, cell string displacement occurs. If press pressure is delayed beyond 7 min, flow marks remain at the glass edge. The ultraviolet cut-off function remains active in double-glass stacks, but the dominant concern shifts to acetic acid release. EVA deacetylates slowly under combined heat, moisture, and electrical bias. In high-system-voltage bifacial arrays, the released acid lowers interfacial pH and aggravates rear-glass corrosion at the edge seal. F806P should therefore be qualified for potential-induced degradation under IEC TS 62804-1:2015 with the specific glass and cell architecture before it is released for utility-scale glass-glass production. Edge sealing with polyisobutylene or butyl tape at 2–4 mm overlap is required to reduce moisture ingress at 85 °C / 85% RH.
Within building-integrated photovoltaic spandrels and overhead glazing, the ultraviolet screening function is coupled to safety-glazing compliance. The laminate build-up is typically 5 mm / 1.52 mm / 5 mm glass or an asymmetric 6 mm / 0.76 mm / 4 mm assembly. F806P is processed as the interlayer in a vacuum bag or autoclave cycle after preliminary tacking. Its ultraviolet cut-off prevents shortwave radiation from accelerating chromophore formation near the glass edge, where reflected ultraviolet and outward-looking building surfaces concentrate photon dose. The yellowness index after xenon arc exposure according to ISO 4892-2:2013 should remain below the project-specific limit, with a typical outdoor acceptance criterion of ΔYI < 3 after 2,000 h. The material must also meet impact classification under EN 12600:2002, which distinguishes drop height and residual strength classes for overhead or barrier glazing. Laminated glass adhesion and durability are tested under ISO 12543-2:2021, while electrical safety of the building-integrated module is assessed under IEC 61730-2:2016. The main process constraint in this segment is uneven heat transfer across large-area glass. Platen heating zones are usually segmented into 6–12 zones, and the center-to-edge temperature deviation must be kept below 3 °C to avoid partial cure at the corners. The F806P layer may be used as a single 0.76 mm interlayer or as two plies for thicker buildup. EVA has higher creep compliance than PVB at service temperatures near 50 °C, so the structural framing must limit laminate deflection in overhead installation. This is an operational boundary: the product is not a substitute for structural PVB or ionomer where post-breakage residual load capacity is the primary design criterion.
Cadmium telluride devices with glass-glass architecture use an encapsulant layer between the rear glass and the semiconductor back-contact stack. If F806P is placed as the rear lamination film, the ultraviolet cut-off package limits photon dose at the CdS window layer along cell edges and in the scribe zones. This matters because the CdS buffer layer is the most ultraviolet-sensitive component in the stack; photo-oxidation at the CdS/TCO interface raises series resistance and reduces fill factor after outdoor exposure. Thin-film lamination is performed at lower pressure than crystalline silicon lamination to avoid crushing the back-contact scribe lines. Vacuum is maintained for 4–6 min before membrane pressure is ramped to 0.040–0.060 MPa. Cure temperature is held at 145–150 °C because the rear glass is often heat-strengthened and thickness variation across the module is greater. The F806P layer is predried at 45–50 °C for 8–12 h when storage relative humidity exceeds 60%. Moisture ingress through EVA is higher than through ionomer or polyolefin encapsulant; therefore edge seal integrity is the limiting factor. Cadmium telluride modules use a transparent conductive oxide layer, and contamination at the CdS/TCO junction from acetic acid is a known degradation mode. The ultraviolet cut-off package reduces one additional oxidative stress at the scribe edge, but it should not be expected to replace dehumidifying edge tape. In arid high-ultraviolet sites, the front glass already absorbs most shortwave radiation; the rear lamination film still sees scattered and reflected ultraviolet through the glass edge, so ultraviolet screening remains relevant. Published data for F806P-specific long-term performance in cadmium telluride configurations is limited.
Solar shingle and building-integrated roof tile lines often use aluminum mold cassettes with non-uniform cavity depth. The F806P film is cut to discontinuous cell and tile geometries and must not shrink more than 1.5% in the machine direction during lamination. Shrinkage is tested before production on a free-standing film sample in a convection oven according to ISO 11501:1995. Under cassette pressure, the encapsulant is compressed into ribbed roof profiles; entrapped air at the rib root produces post-lamination microvoids if the venting schedule is shortened below 4 min. Lamination pressure is intentionally reduced to 0.035–0.055 MPa to prevent cell cracking on curved tiles. The peroxide cure must still reach 75% gel content, but the lower pressure slows heat transfer through the air gap. Some lines add a perforated release sheet to improve vacuum evacuation; this is required when the tile profile exceeds 15 mm in depth. After lamination, the ultraviolet cut-off layer must retain its absorption edge after 1,000 h damp heat at 85 °C / 85% RH and 15 kWh/m² ultraviolet preconditioning per IEC 61215-1:2021.
For low-power portable charging modules produced on short-belt semi-automatic platens, the practical process envelope is a single vacuum/press dwell at 145–150 °C for 10–12 min; published long-term ultraviolet retention data for this specific configuration is limited.
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FIRST Normal Series EVA Film F806P (UV cut-off) is a cross-linkable ethylene-vinyl acetate encapsulant supplied in roll form for photovoltaic module lamination. The normal-cure designation separates it from fast-cure grades by requiring a lamination press residence of 10 min to 15 min at 145 °C to 155 °C for gel fractions above 80 % depending on module construction and cell-plane temperature. The UV cut-off additive package shifts the onset of ultraviolet transmission to approximately 360 nm, absorbing shorter wavelengths that otherwise degrade polyamide backsheet layers and ionomer edge seals. Nominal roll dimensions are 0.45 mm thickness, 1000 mm width, and 150 m length; 0.50 mm and 0.60 mm thicknesses are supplied for thick-cell or glass-glass gap control. Density before crosslinking is typically 0.95 g/cm³ to 0.96 g/cm³. Melt flow rate, measured according to ISO 1133-1:2022 at 190 °C with a 2.16 kg piston load, is held in the 20 g/10 min to 30 g/10 min range during film extrusion; batch-specific certificates of analysis control incoming inventory because moisture uptake and storage temperature shift melt viscosity. The grade is used as the front-side encapsulant in crystalline-silicon modules where UV cut-off is required for rear-side protection, and as the rear-side encapsulant in glass-glass modules when paired with a high-transmittance front encapsulant.
The UV cut-off function is achieved by compounding the EVA with an absorber that attenuates wavelengths below 360 nm without converting absorbed UV into long-lived chromophoric by-products at the front glass interface. The practical effect in module lamination is a reduction in ultraviolet irradiance reaching the cell encapsulation backside and the backsheet internal surface. For a laminated coupon of 0.45 mm F806P between 2 mm low-iron glass and a clear backsheet, spectrophotometric transmittance is below 1 % at 340 nm and rises to the visible plateau between 400 nm and 500 nm. Published data for this specific configuration is limited at wavelengths below 300 nm because glass absorption and surface reflectance dominate the measurement.
Incoming inspection of F806P rolls should include thickness profiling at three positions across the web with a contact micrometer, not less than 0.45 mm ± 0.02 mm for the standard build. Roll width tolerance is typically ±5 mm. Spectral transmittance of a single-layer film sample can be measured with an integrating-sphere spectrophotometer according to IEC 62788-1-1:2020; the 340 nm transmittance is the most sensitive incoming marker for UV absorber concentration drift. A shift of the cut-off edge to 380 nm indicates an over-addition or degradation of the absorber masterbatch and will reduce short-circuit current without improving rear-side protection. Conversely, a cut-off edge below 350 nm indicates under-addition and may fail the customer’s UV-blocking specification. The visual emboss pattern should be uniform across the roll; any streak visible under low-angle inspection suggests melt-temperature non-uniformity at the die lip and may correlate with gel fraction scatter after lamination.
Optical acceptance testing of F806P film is performed on laminated coupons using IEC 62788-1-1:2020 for transmittance and yellowness index, with haze measured by ASTM D1003-13. Typical luminous transmittance across the 400 nm to 1100 nm band is 91.5 % to 93.0 % after lamination, compared with 92.5 % to 94.0 % for high-transmittance EVA. Haze before lamination is dominated by the emboss pattern; after melt collapse and cure, haze typically falls to 5 % to 8 %. Yellowness index after damp-heat exposure at 85 °C and 85 % relative humidity for 1000 h is specified below 2.0. The UV cut-off edge is not a step function; transmittance at 350 nm is below 2 %, transmittance at 380 nm is typically 70 % to 85 %, and transmittance at 500 nm is above 91 %.
| Parameter | F806P UV cut-off | High-transmittance EVA | White EVA |
|---|---|---|---|
| UV transmission onset | ~360 nm | ~320 nm | ~360 nm |
| Transmittance at 340 nm | <1 % | 70 %–85 % | <1 % |
| Transmittance at 550 nm | 91 %–93 % | 92 %–94 % | 10 %–20 % |
| Rear-side reflectance, 450 nm–1100 nm | 5 %–10 % | 5 %–10 % | 80 %–90 % |
| Yellowness index after 1000 h damp heat | <2.0 | <2.0 | <3.0 |
By comparison, high-transmittance EVA uses a less aggressive UV absorber loading and begins transmitting at 320 nm to 330 nm, which supports blue response in bifacial cells but increases rear-side UV dose. White EVA contains a reflective filler that raises rear-side reflectance above 80 % between 450 nm and 1100 nm, making it unsuitable as a front-side layer but useful for light reuse at the rear of monofacial cells. F806P therefore occupies an intermediate optical position: it preserves high visible transmittance while removing the UV component that contributes to backsheet and edge-seal degradation.
Lamination line trials on a two-chamber vacuum laminator with independent upper and lower chamber control have shown that F806P tolerates a cell-plane temperature range of 138 °C to 155 °C without gross bubble formation, provided the vacuum hold is not shortened below 300 s. The melt phase begins between 70 °C and 80 °C; full melt saturation over the cell fingers requires a minimum platen contact time of 240 s before the cure plateau. The film’s embossed surface requires a vacuum ramp from 0.1 MPa to 0.08 MPa during the first 180 s to permit air evacuation between glass and cell string. If chamber pressure is released before the melt phase fills the cell gaps, edge voids appear at busbar transitions where the cell-to-glass gap changes by 0.2 mm to 0.3 mm. Production-scale failures are most commonly observed when a laminator is converted from a fast-cure EVA with a shorter cure plateau; the normal-cure peroxide package in F806P requires the full 10 min to 12 min plateau. Shorter dwell times produce gel fractions of 65 % to 75 % rather than the specified 80 % minimum, which increases creep at the module edge and reduces mechanical load resistance. Rolls stored outside sealed barrier bags at relative humidity above 60 % for more than 24 h should be pre-dried at 40 °C for 4 h before lamination; otherwise, absorbed water can generate steam bubbles during the early melt phase. The film should not be combined with amine-cured backsheet adhesives unless peel testing has confirmed compatibility, because amine species can interfere with silane coupling at the EVA/backsheet interface.
Crosslinking of F806P proceeds through peroxide decomposition during the lamination plateau. The peroxide initiator used in normal-cure EVA has a one-hour half-life temperature in the range of 135 °C to 145 °C, depending on the precise peroxide formulation. Gel fraction after standard lamination, measured by xylene extraction per ASTM D2765-16, is typically 80 % to 90 %. Values below 70 % indicate undercure and correlate with reduced shear modulus after thermal aging. The glass-side adhesion after lamination and 24 h conditioning at 23 °C is typically above 40 N/cm by 180° peel testing; backsheet-side adhesion is typically above 30 N/cm, but the exact value depends on backsheet primer chemistry and surface treatment. Volume resistivity measured according to IEC 62788-1-3:2020 is typically above 1.0 × 10^14 Ω·cm after lamination at 1000 V DC and 23 °C. The film has higher water vapor transmission than polyolefin elastomer encapsulants; for a 0.45 mm cured film, the water vapor transmission rate at 38 °C and 100 % relative humidity is in the 20 g/(m²·day) to 30 g/(m²·day) range. This property limits the use of F806P as the sole moisture barrier in thin-film modules, but it is acceptable in conventional glass-backsheet packages where the backsheet and glass provide the primary moisture resistance.
Elongation at break of the cured film, measured by ASTM D638-14 at 500 mm/min, is typically above 400 %, and tensile strength is typically above 15 MPa. These values change after 1000 h damp-heat exposure; the manufacturer should supply aged coupon data for each lot when the film is used in IEC 61215-1:2021 qualification programs.
| Requirement | Test method or regulation | Typical lot result |
|---|---|---|
| Melt flow rate | ISO 1133-1:2022 | 20–30 g/10 min |
| Tensile strength | ASTM D638-14 | >15 MPa |
| Elongation at break | ASTM D638-14 | >400 % |
| Gel fraction after lamination | ASTM D2765-16 | 80–90 % |
| Volume resistivity | IEC 62788-1-3:2020 | >1.0 × 10^14 Ω·cm |
| Light transmittance/yellowness | IEC 62788-1-1:2020 | >91 %, <2.0 YI |
| Hazardous substances | RoHS 2011/65/EU | Compliant |
| SVHC communication | REACH (EC) No 1907/2006 | None above 0.1 % w/w |
Replacement of a fast-cure EVA with F806P requires extension of the lamination plateau by 5 min to 8 min on single-chamber lines that run a 145 °C platen setpoint. This is the most frequent process conflict in mixed-production facilities because cycle-time targets are ordinarily fixed for fast-cure encapsulants. If the plateau extension cannot be accepted, a higher platen temperature of 155 °C to 160 °C may compensate, but the upper limit is set by backsheet heat-shrink characteristics and the cell string’s solder paste. At platen temperatures above 160 °C, the tensile strain mismatch between the EVA and the backsheet can induce warp after cool-down.
The use of F806P on the front side instead of a high-transmittance grade reduces the short-circuit current of a crystalline-silicon module by approximately 0.5 % to 1.5 % relative to a high-transmittance front encapsulant, because the UV cut-off edge absorbs part of the blue-UV transition region. This current loss is accepted in applications where backsheet UV protection or aesthetic consistency is the higher priority. When F806P is placed on the rear side of a glass-glass bifacial module and a high-transmittance EVA or polyolefin elastomer is used on the front side, the rear UV dose is reduced without a measurable loss in front-side collected current. The rear-side UV cut-off can reduce UV-induced discoloration of rear-side coatings and encapsulant/glass edge interfaces, but published data for this specific configuration is limited.
For white EVA replacement, F806P does not provide rear-side reflectance; it should not be used as a direct substitute when the cell gap is designed to recover light by scattering from a white rear encapsulant. Compared with a polyolefin elastomer, F806P processes on standard EVA lamination lines with lower platens and shorter ramps, but it has higher water vapor transmission and lower volume resistivity after damp heat. Substitution is reviewed only where UV cut-off below 360 nm is an explicit specification and where the laminator thermal profile can hold 145 °C to 155 °C for the normal-cure plateau.